Auteur(s): Corfdir P., Lefebvre P., Levrat J., Dussaigne Amélie, Ristic J., Zhu T., Ganière Jean-Daniel, Grandjean N., Deveaud-Plédran Benoit

Conference: 9th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors. BIAMS 2008 (Tolède, ES, 2008-06-25)