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- Exciton dynamics involving basal stacking faults in a-plane GaN studied by low-temperature time-resolved cathodoluminescence. doi link

Auteur(s): Corfdir P.(Corresp.), Ristic J., Lefebvre P., Dussaigne Amélie, Martin D., Ganière Jean-Daniel, Grandjean N., Deveaud-Plédran Benoit

(Article) Publié: Applied Physics Letters, vol. 94 p.201115 (2009)
Texte intégral en Openaccess : openaccess


Ref HAL: hal-00391736_v1
DOI: 10.1063/1.3142396
WoS: 000266342800015
Exporter : BibTex | endNote
42 Citations
Résumé:

Time-resolved cathodoluminescence at 27 K has been performed on a-plane GaN grown by epitaxial lateral overgrowth. We detail the relaxation and recombination mechanisms of excitons [free or bound to neutral donors, or bound to I1-type basal stacking faults (BSFs)] in relation to the local density in BSFs. We describe the slow exciton capture rate on isolated BSFs by a diffusion model involving donors via a hopping process. Where BSFs are organized into bundles, we relate the shorter rise time to intra-BSF localization processes and the multiexponential decay to the type-II band alignment of BSFs in wurtzite GaN.