Quantification of the Effect of Surface Slope on Mechanical Measurements by Contact-Resonance AFM Auteur(s): Heinze K., Arnould Olivier, Delenne Jean-Yves, Lullien-Pellerin Valerie, Ramonda Michel, George M.
Conference: Forum des Microscopies à Sonde Locale (Juvignac, FR, 2017-03-20) |