Absolute negative resistance in ballistic variable threshold field effect transistors Auteur(s): Dyakonov M., Shur Michael Chapître d'ouvrage: Future Trends In Microelectronics, vol. p.296-303 (2007) Ref HAL: hal-00264791_v1 DOI: 10.1002/9780470168264.ch26 Exporter : BibTex | endNote Résumé: This chapter contains sections titled: * Acknowledgments * References |