At least one electronic device, system and method of manufacturing an electromagnetic wave detector are provided herein. The electronic device for receiving at least one electromagnetic wave of a given frequency may comprise at least one first field effect transistor, and at least one antenna configured to receive the at least one electromagnetic wave and connected to a gate of the at least one first field effect transistor, wherein a length of the gate is in a same order of magnitude as an oscillation length of an oscillation regime of the at least one first field effect transistor at the given frequency, and a width of the gate is such that an impedance presented by the at least one first field effect transistor in the oscillation regime is adapted to an impedance of the at least one antenna.

We report on the photoresponse of 0.7-μm InP double heterojunction bipolar transistor to THz radiation of low and high intensities, when the collector is unbiased. At low intensities, the photoresponse is linear in radiation intensity. Under intense laser radiation, we observe a saturation at intensities > 15 kW/cm2, sample damaging arising around ∼ 40 kW/cm2. The photoresponse as a function of base-emitter bias dependence does not change with the radiation intensity.

We have evaluated the performance of the InP double heterojunction bipolar transistor and InP-based varactors as a room temperature sensitive detectors for THz computed tomography applications. They were used in transmission mode for the 350 GHz and 650 GHz atmospheric windows.

In this paper, an overview of main results concerning THz detection by nanometer field effect transistors (FETs) and heterojunction based transistors (HBTs) is presented. Different GaInAs/InP and GaN/AlGaN nanometer field effect transistors based detectors are presented. We present also first Silicon C-MOS transistors based integrated circuits for wireless communication in sub-THz range. Special attention is given to transistors based focal plane arrays. We show, how these arrays, together with in purpose developed diffractive 3D printed optics lead to construction of the demonstrators of safety and industrial quality control scanners.

—We present the low frequency noise and the photoresponse in InP double heterojunction bipolar transistor (DHBT) THz detectors. A current responsivity of 0.23 A/W and a noise equivalent power of 4·10-10 W/Hz 1/2 have been measured at 1 kHz modulation frequency. The collector bias can substantially reduce the noise equivalent power.

Compact and fast detectors, for imaging and wireless communication applications, require efficient rectification of electromagnetic radiation with frequencies approaching 1 THz and modulation bandwidth up to a few tens of GHz. This can be obtained only by using a mature technology allowing monolithic integration of detectors with low-noise amplifiers. One of the best candidates is indium phosphide bipolar transistor (InP HBT) technology. In this work, we report on room temperature high sensitivity terahertz detection by InP double-heterojunction bipolar transistors (DHBTs) operating in a large frequency range (0.25–3.1 THz). The performances of the DHBTs as terahertz sensors for communications were evaluated showing the modulation bandwidth of investigated DHBTs close to 10 GHz.

We report on THz emission from HgCdTe bulk films. Our experiments clearly show magnetically tunable THz emission that can be attributed to electron radiative recombination between the Landau levels (cyclotron emission). Energy band structure theoretical calculations using Kane Hamiltonian are performed. They allow identification of observed resonances as related to transitions between two lowest conduction band Landau levels.