Accueil > Production scientifique
(146) Production(s) de DIAKONOVA N.
Temperature, Back Gate and Polarization Studies in Nanotransistor based THz plasma detectors Auteur(s): Knap W., But D., Bawedin M., Chang S., Klimenko O., Diakonova N., Coquillat D., El Fatimy A., Teppe F., Gutin A., Nagatsuma T., Cristoloveanu S.
Conférence invité: 21st International Conference on Applied Electromagnetics and Communications ICECom (Dubrovnik, HR, 2013-10-14) |
Field effect transistor as detector of THz radiation helicity Auteur(s): Romanov K., Diakonova N., But D., Teppe F., Knap W., Dyakonov M., Drexler C., Olbrich P., Karch J., Schafberger M., Ganichev S., Mityagin Yu, Klimenko O.
Conference: TERAHERTZ EMITTERS, RECEIVERS, AND APPLICATIONS IV (San-Diego, US, 2013-08-25) |
The dynamic range of THz broadband FET detectors Auteur(s): But D., Diakonova N., Drexler C., Drachenko Oleksiy, Romanov K., Golenkov O. G., Sizov F. F., Gutin A., Shur M., Ganichev S. D., Knap W.
Conference: TERAHERTZ EMITTERS, RECEIVERS, AND APPLICATIONS IV (San-Diego, US, 2013-08-25) |
Nanotransistor based THz plasma detectors: low temperatures, graphene, linearity, and circular polarization studies Auteur(s): Knap W., But D., Diakonova N., Coquillat D., Vitiello M. S., Blin S., El Fatimy A., Teppe F., Tredicucci A., Nagatsuma T., Ganichev S.
Conférence invité: SPIE Optical Engineering + Applications, (San Diego, US, 2013) |
Terahertz imaging using strained-Si MODFETs as sensors Auteur(s): Meziani Y. M., Garcia-Garcia E., Velazquez-Perez J. E., Coquillat D., Diakonova N., Knap W., Grigelionis I., Fobelets K. (Article) Publié: Solid-State Electronics, vol. 83 p.113-117 (2013) |
Magnetospectroscopy of HgTe Based Topological Insulators Auteur(s): Teppe F., Zholudev M., Orlita M., Consejo C., Diakonova N., But D., Coquillat D., Knap W., Mikhailov N. N., Dvoretskii S. A., Aleshkin V., Gavrilenko V.
Conference: SPINTRONICS VI (, FR, 2013-08-29) |
Nanometer size field effect transistors for terahertz detectors Auteur(s): Knap W., Rumyantsev S., Vitiello M. S., Coquillat D., Blin Stéphane, Diakonova N., Shur M., Teppe F., Tredicucci A., Nagatsuma T. (Article) Publié: Nanotechnology, vol. 24 p.214002 (2013) |