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(146) Production(s) de DIAKONOVA N.
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Non-resonant terahertz detection in strained-Si modulation doped field effect transistors: first terahertz imaging  Auteur(s): Garcia E., Meziani Y. m., Velasques J.e., Coquillat D., Diakonova N., Knap W., Grigelionis I., Fobelets K.
Conference: International TeraNano &GDRI Workshop (, JP, 2010-11-24) |
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Influence of High Magnetic Field and Gate Length on Terahertz Detection by Field Effect Transistors Auteur(s): Knap W., Videlier H., Boubanga tombet Stephane, Teppe F., Coquillat D., Diakonova N., Lusakowski J., Karpierz K.
Conférence invité: SET159 Specialists Meeting on Terahertz and Other Electromagnetic Wave Techniques for Defence and Se (Vilnius, LT, 2010-05-03) |
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Field Effect Transistors For Fast Terahertz Detection and Imaging, Auteur(s): Knap W., Nadar S., Videlier H., Boubanga tombet Stephane, Coquillat D., Diakonova N., Teppe F., Et Al.
Conférence invité: 18th International Conference on Microwaves, Radar and Wireless Communications (MIKON-2010) (, LT, 2010-06-14) |
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Terahertz Detection and Emission by Field Effect Transistors: influence of transistor geometry and high magnetic fields Auteur(s): Knap W., Coquillat D., Teppe F., Diakonova N.
Conférence invité: Int.Conference on Infrared Millimeter and Terahertz Waves (IRMMW) 2010 (Rome, IT, 2010-09-05) |
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Field Effect Transistors for Terahertz Detection and Emission Auteur(s): Knap W., Klimenko O., Schuster F., Diakonova N., Coquillat D., Teppe F., Gifard B.
Conférence invité: 20th International Conference on Applied Electromagnetics and Communications (Dubrovnik, HR, 2010-09-20) |
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Silicon versus III-V semiconductor material choice for terahertz imaging with nanometerfield effect transistors based detectors Auteur(s): Knap W., Coquillat D., Diakonova N., Teppe F.
Conférence invité: 5th Int. Conference on Materials Science and Condensed Matter Physics MSCMP 2010 (, MD, 2010-09-13) |
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Field Effect Transistors For Terahertz Detection and Imaging Auteur(s): Knap W., Coquillat D., Diakonova N., Teppe F., Karpierz K., Monfray S, Skotnicki Thomas, Lusakowski J.
Conférence invité: International Conference on Semiconductor Mid-IR Materials and Optics SMMO 2010 (, PL, 2010-10-21) |
