Quantum Hall resistance standard in graphene devices under relaxed experimental conditions Auteur(s): Ribeiro-Palau R., Lafont F., Brun-Picard J., Kazazis D., Michon A., Cheynis F., Couturaud O., Consejo C., Jouault B., Poirier W., Schopfer F. (Article) Publié: Nature Nanotechnology, vol. 10 p.965 - 971 (2015) Ref HAL: hal-01615243_v1 DOI: 10.1038/nnano.2015.192 WoS: 000364528300014 Exporter : BibTex | endNote 92 Citations |