Raman spectroscopy of v-SiO2 under rare gas compression Auteur(s): Weigel C., Foret M., Hehlen B., Kint M., Clement S., Polian Alain, Vacher R., Ruffle B.
Conference: Glass & Optical Materials Division Annual Meeting 2016 (Madison (WI), US, 2016-05-25) |