Magnetic field effect on the terahertz emission from nanometer InGaAs/AlInAs high electron mobility transistors Auteur(s): Diakonova N., Teppe F., Lusakowski J, Knap W., Levinshtein M, Dmitriev Ap, Shur Ms, Bollaert S, Cappy A (Article) Publié: Journal Of Applied Physics, vol. 97 p.114313 (2005) Ref HAL: hal-00540641_v1 DOI: 10.1063/1.1921339 WoS: 000229804700107 Exporter : BibTex | endNote 66 Citations Résumé: The influence of the magnetic field on the excitation of plasma waves in InGaAs/AlInAs lattice matched high electron mobility transistors is reported. The threshold source-drain voltage of the excitation of the terahertz emission shifts to higher values under a magnetic field increasing from 0 to 6 T. We show that the main change of the emission threshold in relatively low magnetic fields (smaller than approximately 4 T) is due to the magnetoresistance of the ungated parts of the channel. In higher magnetic fields, the effect of the magnetic field on the gated region of the device becomes important. (C) 2005 American Institute of Physics. |