SIMS Investigation of Ge and N Incorporation in 3C-SiC Layers Grown by VLS from Ge-Si Melts Auteur(s): Peyre H., Habka Nada, Soulière Véronique, Soueidan Maher, Ferro Gabriel, Monteil Yves, Camassel J.
Conference: Hetero-SiC'07 (Grenoble, FR, 2007-06-28) |