SIMS Investigation of Ge Incorporation in 3C-SiC Layers Grown from Ge-Si Melts Auteur(s): Peyre H., Habka Nada, Soulière Véronique, Soueidan Maher, Ferro Gabriel, Monteil Yves, Camassel J.
Conference: 6th European Conference on Silicon Carbide and Related Materials (Newcastle upon Tyne, GB, 2006-09) Ref HAL: hal-02042524_v1 DOI: 10.4028/www.scientific.net/MSF.556-557.477 WoS: 000249653900114 Exporter : BibTex | endNote 2 Citations |