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- SIMS Investigation of Ge Incorporation in 3C-SiC Layers Grown from Ge-Si Melts doi link

Auteur(s): Peyre H., Habka Nada, Soulière Véronique, Soueidan Maher, Ferro Gabriel, Monteil Yves, Camassel J.

Conference: 6th European Conference on Silicon Carbide and Related Materials (Newcastle upon Tyne, GB, 2006-09)