Influence of Growth Temperature on Site Competition Effects During Chemical Vapor Deposition of 4H-SiC Layers

Light emission in polar group-III nitride quantum wells optically pumped at densities significantly below the lasing threshold is usually interpreted in terms of excitons. Such excitons are characterized by a non-zero dipole moment and long radiative lifetimes, because their constituent electron and hole are spatially separated by the built-in electric field in the growth direction. These features result in many interesting properties of dipolar excitons: they can propagate over large distances and thus cool down to the lattice temperature before recombination, offering the possibility for studies of cold and dense gas of interacting bosons. In this context, two important issues must be addressed: the strength of the exciton-exciton interaction, and the excitonic Mott transition, that sets the maximum density of excitons. Combining spatially and time-resolved photoluminescence in different excitation geometries, we provide a set of experimental data showing that the emission linewidth is proportional to the emission energy in a wide range of carrier densities and temperatures. The proportionality coefficient is almost temperature independent. These results are compared to the existing data in various material systems and discussed in terms of the Mott transition and its criteria, exciton-exciton interaction and its possible contribution to the linewidth, as well as the role of disorder in the density-dependent emission spectra.

Light emission in polar group-III nitride quantum wells (QWs) optically pumped at densities significantly below the lasing threshold is usually interpreted in terms of excitons. Whereas thin GaN QWs with fast radiative lifetimes are employed in light-emitting devices, the excitons in thick QWs (typ. 7nm) are characterized by a non-zero dipole moment and long radiative lifetimes, due to the built-in electric field. These features result in many interesting properties of dipolar excitons: they can propagate over large distances and thus cool down to the lattice temperature before recombination, offering the possibility for studies of cold and dense gas of interacting bosons. In this context, two important issues must be addressed: the strength of the exciton-exciton interaction, and the excitonic Mott transition, that sets the maximum density of excitons. Combining spatially and time-resolved photoluminescence in different excitation geometries, we provide a set of experimental data showing that the emission linewidth is proportional to the emission energy in a wide range of carrier densities and temperatures. The proportionality coefficient is almost temperature independent. These results are compared to the existing data in various material systems and discussed in terms of the Mott transition and its criteria, exciton-exciton interaction and its possible contribution to the linewidth, as well as the role of disorder in the density-dependent emission spectra.

Thermal decomposition of silicon carbide (SiC) provides transfer free and wafer-scale homogeneous graphene forming on a semi-insulating substrate. Large-area monolayer graphene growth was initially developed at the atmospheric pressure (around 900 mbar) in an argon ambient and at high temperature (>1650°C). However, it remains challenging to obtain films with different and controlled characteristics such as the number of graphene layers or the doping by tuning the growth parameters. In this work, we optimized the epitaxial growth of monolayer graphene (1LG) on 4H-SiC (0001) under a low argon pressure of 10 mbar. This intermediate pressure allows growing a continued 1LG in a short process time of ~1h30. Here, we discuss the initial growth stages from buffer layer to 1LG as a function of annealing temperature (same heating rate). The combined Raman spectroscopy and atomic force microscopy (AFM) analyses show that a buffer layer, fully covering the Si-face of SiC, forms as the first step of growth (1600°C). Subsequently, 1LG starts to grow at step edges (1700°C) and continue to cover the buffer layer with a step-flow growth mechanism, as shown in the literature. Eventually, continued large-scale graphene films were achieved at 1750°C with a reproducible process. These graphene films were characterised by Raman, STM and electrical measurement. The integrated intensity of G-band in Raman spectra normalized with respect to a HOPG reference, AG/AG-HOPG, of each spectrum in Raman map is very close to the experimental value reported for a 1LG. Atomically resolved scanning tunnelling microscopy evidences a (6x6) superstructure, indicative of 1LG covering a reconstructed interface layer. Moreover, quantum Hall plateau values observed in our graphene layers confirmed both continuity and thickness of the 1LG film. The carrier density of pHall~1010 - 1011 cm-2 in 1LG films can be achieved at 1.7K in helium atmosphere. Thus, our as-grown 1LG graphene films with low p-type carrier density provide perspectives for further studies and applications on graphene.

Light emission in polar group-III nitride quantum wells (QWs) optically pumped at densities significantly below the lasing threshold is usually interpreted in terms of excitons. Whereas thin GaN QWs with fast radiative lifetimes are employed in light-emitting devices, the excitons in thick QWs (typ. 7nm) are characterized by a non-zero dipole moment and long radiative lifetimes, due to the built-in electric field. These features result in many interesting properties of dipolar excitons: they can propagate over large distances and thus cool down to the lattice temperature before recombination, offering the possibility for studies of cold and dense gas of interacting bosons. In this context, two important issues must be addressed: the strength of the exciton-exciton interaction, and the excitonic Mott transition, that sets the maximum density of excitons. Combining spatially and time-resolved photoluminescence in different excitation geometries, we provide a set of experimental data showing that the emission linewidth is proportional to the emission energy in a wide range of carrier densities and temperatures. The proportionality coefficient is almost temperature independent. These results are compared to the existing data in various material systems and discussed in terms of the Mott transition and its criteria, exciton-exciton interaction and its possible contribution to the linewidth, as well as the role of disorder in the density-dependent emission spectra.

Different methods for cross-section doping topography of SiC Trenched-singly-implanted vertical junction field effect transistors (TSI-VJFETs) are presented with the purpose to determine the doping distribution in the epitaxial structure and the implanted areas.