DEPTH PROFILING OF CARRIERS IN ZNSE/GAAS HETEROSTRUCTURES BY RAMAN-SPECTROSCOPY Auteur(s): Pagès O., Renucci Ma, Briot O., Cloitre T., Aulombard R.
Conference: 5TH INTERNATIONAL CONF ON II-VI-COMPOUNDS ( II-VI-91 ) (Tamano, JP, 1991) Ref HAL: hal-00547295_v1 Exporter : BibTex | endNote Résumé: Non-intentionally doped ZnSe epilayers grown on (100) semi-insulating GaAs substrates by the MOVPE technique constitute heterostructures exhibiting "apparent" p-type conductivity, which we have investigated by Raman spectroscopy. The Raman spectrum of the substrate gives evidence of the presence of a p-type carrier gas in GaAs with p ranging from 10(18) to 10(20) cm-3, which appears as confined at the interface of ZnSe/GaAs. We have shown that the indium dots used for Hall-effect measurements diffuse through the epilayer up to the interfacial gas and concluded that this one is responsible for the large p-type conductivity of the samples. Moreover a quantitative analysis gives access to the interfacial gas thickness, typically 1000 angstrom. |