Discontinuous change in smectic layer thickness in ferrielectric liquid crystals Auteur(s): Panov V.P., Vij J.K., Panarin Yu.P., Blanc C., Lorman V., Goodby J.W. (Article) Publié: Physical Review E: Statistical, Nonlinear, And Soft Matter Physics, vol. 75 p.042701 (2007) Texte intégral en Openaccess : Ref HAL: hal-00378244_v1 PMID 17500942 DOI: 10.1103/PhysRevE.75.042701 WoS: 000246073900100 Exporter : BibTex | endNote 19 Citations Résumé: The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle. Commentaires: 4 pp. |